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Electrical characteristics of silicon nanowires with scanning force microscope : 원자간력 현미경을 이용한 실리콘 나노선의 전기적 특성에 관한 연구
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- Authors
- Advisor
- 국양
- Issue Date
- 2008
- Publisher
- 서울대학교 대학원
- Keywords
- 실리콘 나노선 ; silicon nanowire ; SLS(solid-liquid-solid)성장법 ; SLS(solid-liquid-solid) ; 양자섬 ; quantum dot ; 주사 게이트 현미경 ; Scanning Gate Microscopy ; 정전기력 현미경 ; Electrostatic Force Microscopy
- Description
- Thesis(doctors)--서울대학교 대학원 :물리학부,2008.2.
- Language
- English
- URI
- http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000039356
https://hdl.handle.net/10371/46378
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