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주사탐침열현미경을 활용한 마이크로스케일 온도 측정기법에 관한 정성적 연구 : Qualitative investigation of microscale temperature measurement using scanning thermal microscopy
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- Authors
- Advisor
- 이준식
- Issue Date
- 2007
- Publisher
- 서울대학교 대학원
- Keywords
- 주사탐침열현미경 ; Scanning thermal microscopy ; SOI 트랜지스터 ; SOI transistor ; 열전효과 ; Thermoelectric effect
- Description
- 학위논문(석사) --서울대학교 대학원 :기계항공공학부,2007.
- Language
- Korean
- URI
- http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000043772
https://hdl.handle.net/10371/48229
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