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C-V 방법을 이용한 저온 다결정 실리콘 박막 트랜지스터의 신뢰성 분석
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | 한민구 | - |
| dc.contributor.author | 문국철 | - |
| dc.date.accessioned | 2010-02-02T07:09:17Z | - |
| dc.date.available | 2010-02-02T07:09:17Z | - |
| dc.date.copyright | 2003. | - |
| dc.date.issued | 2003 | - |
| dc.identifier.uri | http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000059986 | kog |
| dc.identifier.uri | https://hdl.handle.net/10371/48353 | - |
| dc.description | 학위논문(석사)--서울대학교 대학원 :전기·컴퓨터공학부,2003. | ko |
| dc.format.extent | iii, 81 장 | ko |
| dc.language.iso | ko | ko |
| dc.publisher | 서울대학교 대학원 | ko |
| dc.subject | poly-Si | ko |
| dc.subject | Poly-si | ko |
| dc.subject | TFT | ko |
| dc.subject | Tft | ko |
| dc.subject | C-V | ko |
| dc.subject | C-v | ko |
| dc.subject | Hot Carrier Stress | ko |
| dc.subject | Hot carrier stress | ko |
| dc.subject | 결함(trap) | ko |
| dc.subject | Tap | ko |
| dc.subject | 결정입계 (grain boundary) | ko |
| dc.subject | Grain boundary | ko |
| dc.title | C-V 방법을 이용한 저온 다결정 실리콘 박막 트랜지스터의 신뢰성 분석 | ko |
| dc.type | Thesis | - |
| dc.contributor.department | 전기·컴퓨터공학부 | - |
| dc.description.degree | Master | ko |
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