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(A)Statistical method for reliability of tunneling oxide in the flash memory : Flash 메모리의 터널링 산화막 신뢰성 예측을 위한 통계적 방법
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | 박영준 | - |
| dc.contributor.author | 심병섭 | - |
| dc.date.accessioned | 2010-02-02T08:27:49Z | - |
| dc.date.available | 2010-02-02T08:27:49Z | - |
| dc.date.copyright | 2006. | - |
| dc.date.issued | 2006 | - |
| dc.identifier.uri | http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000048781 | eng |
| dc.identifier.uri | https://hdl.handle.net/10371/48531 | - |
| dc.description | Thesis(doctoral)--서울대학교 대학원 :전기. 컴퓨터공학부,2006. | en |
| dc.format.extent | xvi, 130 leaves | en |
| dc.language.iso | en | en |
| dc.publisher | 서울대학교 대학원 | en |
| dc.subject | 신뢰성 | en |
| dc.subject | reliability | en |
| dc.subject | 플래쉬메모리 | en |
| dc.subject | flash memory | en |
| dc.subject | retention | en |
| dc.subject | retention | en |
| dc.subject | stress induced leakage current | en |
| dc.subject | stress induced leakage current | en |
| dc.subject | 산화막 트랩 | en |
| dc.subject | oxide trap | en |
| dc.subject | dispersive transport | en |
| dc.subject | dispersive transport | en |
| dc.subject | 공간분포 | en |
| dc.subject | spatial distribution | en |
| dc.title | (A)Statistical method for reliability of tunneling oxide in the flash memory | en |
| dc.title.alternative | Flash 메모리의 터널링 산화막 신뢰성 예측을 위한 통계적 방법 | en |
| dc.type | Thesis | - |
| dc.contributor.department | 전기. 컴퓨터공학부 | - |
| dc.description.degree | Doctor | en |
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