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ZMR법에 의한 실리콘 박막의 단결정화 과정의 해석과 박막 트랜지스터에의 응용 : Analysis of single crystallization process of silicon thin films by ZMR method and its application to thin film transistor

DC Field Value Language
dc.contributor.advisor주승기-
dc.contributor.author이시우-
dc.date.accessioned2010-02-05T06:44:05Z-
dc.date.available2010-02-05T06:44:05Z-
dc.date.copyright1996.-
dc.date.issued1996-
dc.identifier.urihttp://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000081625kog
dc.identifier.urihttps://hdl.handle.net/10371/50867-
dc.description학위논문(박사)--서울대학교 대학원 :금속공학과,1996.ko
dc.format.extentx, 123 장ko
dc.language.isokoko
dc.publisher서울대학교 대학원ko
dc.subject실리콘ko
dc.subjectsiliconko
dc.subject할로겐 램프ko
dc.subjectSOIko
dc.subject전산모사ko
dc.subjectZMRko
dc.subject계면 안정성ko
dc.subjecthalogen lampko
dc.subject복사과냉ko
dc.subjectcomputer simulationko
dc.titleZMR법에 의한 실리콘 박막의 단결정화 과정의 해석과 박막 트랜지스터에의 응용ko
dc.title.alternativeAnalysis of single crystallization process of silicon thin films by ZMR method and its application to thin film transistorko
dc.typeThesis-
dc.contributor.department금속공학과-
dc.description.degreeDoctorko
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