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Study on RTS noise of the nano-scale MOSFET and its application to CMOS image sensor readout circuit : MOSFET의 RTS 노이즈 연구와 CMOS image sensor readout 회로에의 적용
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | 신형철 | - |
| dc.contributor.author | 이호철 | - |
| dc.date.accessioned | 2010-02-09T14:56:13Z | - |
| dc.date.available | 2010-02-09T14:56:13Z | - |
| dc.date.copyright | 2007. | - |
| dc.date.issued | 2007 | - |
| dc.identifier.uri | http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000045807 | eng |
| dc.identifier.uri | https://hdl.handle.net/10371/53516 | - |
| dc.description | Thesis(master`s)--서울대학교 대학원 :전기·컴퓨터공학부,2007. | en |
| dc.format.extent | iv, 66 leaves | en |
| dc.language.iso | en | en |
| dc.publisher | 서울대학교 대학원 | en |
| dc.subject | 저주파 노이즈 | en |
| dc.subject | CMOS Image Sensor | en |
| dc.subject | 이미지 센서 | en |
| dc.subject | Random Telegraph Signal Noise | en |
| dc.subject | 전계효과트랜지스터 | en |
| dc.subject | Oxide trap | en |
| dc.subject | Time constants | en |
| dc.subject | Location of trap | en |
| dc.subject | FN-stress | en |
| dc.subject | Dual oxide device | en |
| dc.subject | Single oxide device | en |
| dc.title | Study on RTS noise of the nano-scale MOSFET and its application to CMOS image sensor readout circuit | en |
| dc.title.alternative | MOSFET의 RTS 노이즈 연구와 CMOS image sensor readout 회로에의 적용 | en |
| dc.type | Thesis | - |
| dc.contributor.department | 전기·컴퓨터공학부 | - |
| dc.description.degree | Master | en |
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