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Electroreflectance Study of Zn0.8Mg0.2O/ZnO Nanorod Heterostructures

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Authors

Kim, Sung Soo; Lim, Hyun Jin; Cheong, Hyeonsik; Park, Won Il; Yi, Gyu-Chul

Issue Date
2005-06-22
Publisher
한국물리학회 = The Korean Physical Society
Citation
J. Korean Phys. Soc. 46, S214 (2005)
Keywords
Zinc oxideNanorodHeterostructureElectroreflectance
Abstract
ZnO, due to its large exciton binding energy which enables excitonic recombination at room temperature, is attracting much attention as a material for room-temperature UV devices. In particular, ZnO nanorod has attracted a great deal of attention because of the commercial interest in short-wavelength semiconductor laser diodes and nanometer-scale electronic devices. Zn0.8Mg0.2O/ZnO nanorod heterostructures were grown by metal-organic vapor-phase epitaxy on catalyst-free ZnO nanorods. Electro reflectance measurements were carried out at temperatures between 90 K and 295 K and compared with photoluminescence data. Quantum confinement effects in Zn0.8Mg0.2O/ZnO nanorod heterostructures were observed.
ISSN
0374-4884
Language
English
URI
http://www.kps.or.kr

https://hdl.handle.net/10371/5428
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