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Electroreflectance Study of Zn0.8Mg0.2O/ZnO Nanorod Heterostructures
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- Authors
- Issue Date
- 2005-06-22
- Publisher
- 한국물리학회 = The Korean Physical Society
- Citation
- J. Korean Phys. Soc. 46, S214 (2005)
- Keywords
- Zinc oxide ; Nanorod ; Heterostructure ; Electroreflectance
- Abstract
- ZnO, due to its large exciton binding energy which enables excitonic recombination at room temperature, is attracting much attention as a material for room-temperature UV devices. In particular, ZnO nanorod has attracted a great deal of attention because of the commercial interest in short-wavelength semiconductor laser diodes and nanometer-scale electronic devices. Zn0.8Mg0.2O/ZnO nanorod heterostructures were grown by metal-organic vapor-phase epitaxy on catalyst-free ZnO nanorods. Electro reflectance measurements were carried out at temperatures between 90 K and 295 K and compared with photoluminescence data. Quantum confinement effects in Zn0.8Mg0.2O/ZnO nanorod heterostructures were observed.
- ISSN
- 0374-4884
- Language
- English
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