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Morphology of thin films of lamellar diblock copolymers

DC Field Value Language
dc.contributor.authorKim, Y. S.-
dc.contributor.authorSuh, K. Y.-
dc.contributor.authorLee, Hong H.-
dc.date.accessioned2009-08-06T05:33:56Z-
dc.date.available2009-08-06T05:33:56Z-
dc.date.issued1997-10-
dc.identifier.citationPhys. Rev. E. 56, 4887 (1997)en
dc.identifier.issn1539-3755-
dc.identifier.urihttps://hdl.handle.net/10371/6264-
dc.description.abstractThe morphology of unconfined thin films is determined for lamellar diblock copolymers. A criterion is developed for the conditions for island formation or flat surface. Also derived is the critical thickness of the film below which the morphology goes through a change from the flat surface to island structure. The period of underlying lamellar structure when islands form is determined.en
dc.language.isoenen
dc.publisherThe American Physical Societyen
dc.subjectFREE-SURFACEen
dc.titleMorphology of thin films of lamellar diblock copolymersen
dc.typeArticleen
dc.contributor.AlternativeAuthor서갑양-
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