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Capillary force lithography: Large-area patterning, self-organization, and anisotropic dewetting

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dc.contributor.authorSuh, K. Y.-
dc.contributor.authorLee, Hong H.-
dc.date.accessioned2009-08-06T06:24:48Z-
dc.date.available2009-08-06T06:24:48Z-
dc.date.issued2002-06-
dc.identifier.citationAdv. Funct. Mater. 2002, 12, 405en
dc.identifier.issn1616-301X-
dc.identifier.urihttps://hdl.handle.net/10371/6273-
dc.description.abstractThis article gives an overview on a new lithographic technique called capillary force lithography for large-area patterning. The technique simply involves placing a polydimethylsiloxane model on a polymer film, which is then heated above the glass-transition temperature of the polymer. Various useful microstructures can be obtained by sequential applications of the technique through self-organization. Dewetting, which can be observed in capillary force lithography for relatively thin films, is also described as a new pathway for realizing anisotropic dewetting.en
dc.language.isoenen
dc.publisherJohn Wiley & Sonsen
dc.subjectTHIN POLYMER-FILMSen
dc.subjectTEMPERATURE IMPRINT LITHOGRAPHYen
dc.subjectASSEMBLED MONOLAYERSen
dc.subjectSURFACESen
dc.subjectMICROSTRUCTURESen
dc.subjectAnisotropic dewettingen
dc.subjectLithography capillary forceen
dc.subjectPatterning 3Den
dc.subjectPoly(dimethylsiloxanes) (PDMS)en
dc.titleCapillary force lithography: Large-area patterning, self-organization, and anisotropic dewettingen
dc.typeArticleen
dc.identifier.doi10.1002/1616-3028(20020618)12:6/7<405::AID-ADFM405>3.0.CO;2-1-
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