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Detection of Process Faults by Multiscale-Based Methods : 다중척도 방법을 이용한 공정의 결함 감지
DC Field | Value | Language |
---|---|---|
dc.contributor.advisor | 오희석 | - |
dc.contributor.author | 이승은 | - |
dc.date.accessioned | 2010-05-10T22:53:17Z | - |
dc.date.available | 2010-05-10T22:53:17Z | - |
dc.date.copyright | 2010 | - |
dc.date.issued | 2010 | - |
dc.identifier.uri | http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000033061 | eng |
dc.identifier.uri | https://hdl.handle.net/10371/65319 | - |
dc.description | Thesis(masters) --서울대학교 대학원 :통계학과,2010.2. | en |
dc.format.extent | 21 leaves | en |
dc.language.iso | en | en |
dc.publisher | 서울대학교 대학원 | en |
dc.subject | 결함감지 | en |
dc.subject | classification | en |
dc.subject | 다중척도 구조 | en |
dc.subject | process faults | en |
dc.subject | 웨이블릿 | en |
dc.subject | support vector machines | en |
dc.subject | 오분류율 | en |
dc.subject | unbalanced Haar | en |
dc.subject | wavelets | en |
dc.title | Detection of Process Faults by Multiscale-Based Methods | en |
dc.title.alternative | 다중척도 방법을 이용한 공정의 결함 감지 | en |
dc.type | Thesis | - |
dc.contributor.department | 통계학과 | - |
dc.description.degree | Master | en |
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