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REAL-TIME RISK MEASUREMENT FOR BUSINESS ACTIVITY MONITORING (BAM)

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dc.contributor.authorKang, Bokyoung-
dc.contributor.authorCho, Nam Wook-
dc.contributor.authorKang, Suk-Ho-
dc.date.accessioned2012-03-05T02:31:52Z-
dc.date.available2012-03-05T02:31:52Z-
dc.date.issued2009-11-01-
dc.identifier.citationINTERNATIONAL JOURNAL OF INNOVATIVE COMPUTING INFORMATION AND CONTROL; Vol.5 11A; 3647-3657-
dc.identifier.issn1349-4198-
dc.identifier.urihttps://hdl.handle.net/10371/75356-
dc.description.abstractThis paper proposes a methodology to measure the risk level in real-time for Business Activity Monitoring (BAM). A decision-tree methodology was employed to analyze the effect of process attributes on the result of the process execution. In the course of process execution, the level of risk is monitored in real-time, and an early warning can be issued depending on the change of the risk level. An algorithm for estimating the risk of ongoing processes in real-time was formulated. Comparison experiments were conducted to demonstrate the effectiveness of our method. The proposed method detects the risks of business processes more precisely and even earlier than existing approaches.-
dc.language.isoen-
dc.publisherICIC INT-
dc.subjectEvent processing-
dc.subjectDecision tree-
dc.subjectRisk measurement-
dc.subjectBusiness activity monitoring-
dc.titleREAL-TIME RISK MEASUREMENT FOR BUSINESS ACTIVITY MONITORING (BAM)-
dc.typeArticle-
dc.contributor.AlternativeAuthor강보경-
dc.contributor.AlternativeAuthor조남욱-
dc.contributor.AlternativeAuthor강석호-
dc.citation.journaltitleINTERNATIONAL JOURNAL OF INNOVATIVE COMPUTING INFORMATION AND CONTROL-
dc.description.citedreferenceKusunoki Y, 2008, INT J INNOV COMPUT I, V4, P2663-
dc.description.citedreferenceCamci F, 2008, PATTERN RECOGN, V41, P3021, DOI 10.1016/j.patcog.2008.04.001-
dc.description.citedreferenceGuh RS, 2008, COMPUT IND ENG, V55, P475, DOI 10.1016/j.cie.2008.01.013-
dc.description.citedreferenceNakashima T, 2008, INT J INNOV COMPUT I, V4, P749-
dc.description.citedreferenceChen RC, 2008, INT J INNOV COMPUT I, V4, P413-
dc.description.citedreferenceMendling J, 2008, DATA KNOWL ENG, V64, P312, DOI 10.1016/j.datak.2007.06.019-
dc.description.citedreferenceCHANG CP, 2008, INFORM SOFTWARE TECH, V51, P375-
dc.description.citedreferenceKIM SW, 2008, LECT NOTE COMPUTER S, V4443, P201-
dc.description.citedreferenceSharma A, 2007, COMPUT SECUR, V26, P488, DOI 10.1016/j.cose.2007.10.003-
dc.description.citedreferenceAbadeh MS, 2007, ENG APPL ARTIF INTEL, V20, P1058, DOI 10.1016/j.engappai.2007.02.007-
dc.description.citedreferenceRusinov LA, 2007, CHEMOMETR INTELL LAB, V88, P18, DOI 10.1016/j.chemolab.2006.11.007-
dc.description.citedreferencePeddabachigari S, 2007, J NETW COMPUT APPL, V30, P114, DOI 10.1016/j.jnca.2005.06.003-
dc.description.citedreferenceKIM H, 2007, LECT NOTES COMPUT SC, V4553, P581-
dc.description.citedreferenceNelwamondo FV, 2006, INT J INNOV COMPUT I, V2, P1281-
dc.description.citedreferenceBerdjag D, 2006, INT J INNOV COMPUT I, V2, P1337-
dc.description.citedreferenceRagot J, 2006, J PROCESS CONTR, V16, P887, DOI 10.1016/j.jprocont.2006.06.005-
dc.description.citedreferenceAlbaghdadi M, 2006, RELIAB ENG SYST SAFE, V91, P602, DOI 10.1016/j.ress.2005.05.001-
dc.description.citedreferenceHa BH, 2006, DATA KNOWL ENG, V56, P64, DOI 10.1016/j..datak.2005.02.007-
dc.description.citedreferenceLUNDBERG A, 2006, BUSINESS INTELLIGENC, V11, P55-
dc.description.citedreferenceALLES M, 2006, INT J ACCOUNTING INF, V7, P137-
dc.description.citedreferenceCASTELLANOS M, 2006, LECT NOTES COMPUTER, V3433, P1-
dc.description.citedreferenceWang D, 2005, J PROCESS CONTR, V15, P869, DOI 10.1016/j.jprocont.2005.04.001-
dc.description.citedreferenceWang MH, 2005, KNOWL-BASED SYST, V18, P257, DOI 10.1016/j.knosys.2004.04.012-
dc.description.citedreferenceGrigori D, 2004, COMPUT IND, V53, P321, DOI 10.1016/j.compind.2003.10.007-
dc.description.citedreferenceVASARHELYI MA, 2004, J EMERGING TECHNOLOG, V1, P1-
dc.description.citedreferenceLeymann F, 2002, IBM SYST J, V41, P198-
dc.description.citedreferenceLUCKHAM DC, 2002, POWER EVENTS-
dc.description.citedreferenceDUDA RO, 2001, PATTERN CLASSIFICATI-
dc.description.citedreferenceMITCHELL TM, 1997, MACHINE LEARNING-
dc.description.citedreferenceROLLAND C, 1993, P 3 EUR JAP SEM INF, P86-
dc.description.citedreferenceLAMPORT L, 1978, COMMUN ACM, V21, P558-
dc.description.tc2-
dc.identifier.wosid000271918900004-
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