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Economic-statistical Design of 2-of-2 and 2-of-3 Runs Rule Scheme
DC Field | Value | Language |
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dc.contributor.author | Kim, Young-Bok | - |
dc.contributor.author | Hong, Jung-Sik | - |
dc.contributor.author | Lie, Chang-Hoon | - |
dc.date.accessioned | 2012-03-05T02:32:05Z | - |
dc.date.available | 2012-03-05T02:32:05Z | - |
dc.date.issued | 2009-03-01 | - |
dc.identifier.citation | QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL; Vol.25 2; 215-228 | - |
dc.identifier.issn | 0748-8017 | - |
dc.identifier.uri | https://hdl.handle.net/10371/75359 | - |
dc.description.abstract | In this paper, we investigate the economic-statistical design method for the 2-of-2 runs rule and the 2-of-3 runs rule. The Markov chain approach is used to obtain the average run length and the process cycle time. In addition, a simplified algorithm is presented to search the optimal setting of the design parameters. A numerical example and sensitivity analysis are also provided to compare the performances of the runs rules. The results show that the use of runs rule scheme can reduce operating cost comparing with the Shewhart control chart while maintaining a good statistical performance. Copyright (C) 2008 John Wiley & Sons, Ltd. | - |
dc.language.iso | en | - |
dc.publisher | JOHN WILEY & SONS LTD | - |
dc.subject | economic-statistical design | - |
dc.subject | Markov chain approach | - |
dc.subject | average run length | - |
dc.subject | runs rule | - |
dc.subject | average time to signal | - |
dc.title | Economic-statistical Design of 2-of-2 and 2-of-3 Runs Rule Scheme | - |
dc.type | Article | - |
dc.contributor.AlternativeAuthor | 김영복 | - |
dc.contributor.AlternativeAuthor | 홍정식 | - |
dc.contributor.AlternativeAuthor | 이창훈 | - |
dc.identifier.doi | 10.1002/qre.963 | - |
dc.citation.journaltitle | QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL | - |
dc.description.citedreference | ACOSTAMEJIA CA, 2007, QUALITY ENG, V19, P129, DOI 10.1080/17513470701263641 | - |
dc.description.citedreference | KHOO MBC, 2006, QUALITY ENG, V18, P173, DOI 10.1080/08982110600567517 | - |
dc.description.citedreference | Klein M, 2000, J QUAL TECHNOL, V32, P427 | - |
dc.description.citedreference | Zhang GQ, 1997, COMPUT IND ENG, V32, P575 | - |
dc.description.citedreference | Prabhu SS, 1997, INT J PROD ECON, V49, P1 | - |
dc.description.citedreference | Runger GC, 1996, J AM STAT ASSOC, V91, P1701 | - |
dc.description.citedreference | HURWITZ AM, 1992, QUALITY ENG, V5, P21 | - |
dc.description.citedreference | LUCAS JM, 1990, TECHNOMETRICS, V32, P1 | - |
dc.description.citedreference | SANIGA EM, 1989, TECHNOMETRICS, V31, P313 | - |
dc.description.citedreference | CHAMP CW, 1987, TECHNOMETRICS, V29, P393 | - |
dc.description.citedreference | LORENZEN TJ, 1986, TECHNOMETRICS, V28, P3 | - |
dc.description.citedreference | DUNCAN AJ, 1986, QUALITY CONTROL IND | - |
dc.description.citedreference | WHEELER DJ, 1983, J QUAL TECHNOL, V15, P155 | - |
dc.description.citedreference | BROOK D, 1972, BIOMETRIKA, V59, P539 | - |
dc.description.citedreference | TAYLOR HM, 1968, TECHNOMETRICS, V10, P479 | - |
dc.description.citedreference | DUNCAN AJ, 1956, J AM STAT ASSOC, V51, P228 | - |
dc.description.tc | 1 | - |
dc.identifier.wosid | 000263727600007 | - |
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