Browse

Economic-statistical Design of 2-of-2 and 2-of-3 Runs Rule Scheme

DC Field Value Language
dc.contributor.authorKim, Young-Bok-
dc.contributor.authorHong, Jung-Sik-
dc.contributor.authorLie, Chang-Hoon-
dc.date.accessioned2012-03-05T02:32:05Z-
dc.date.available2012-03-05T02:32:05Z-
dc.date.issued2009-03-01-
dc.identifier.citationQUALITY AND RELIABILITY ENGINEERING INTERNATIONAL; Vol.25 2; 215-228-
dc.identifier.issn0748-8017-
dc.identifier.urihttps://hdl.handle.net/10371/75359-
dc.description.abstractIn this paper, we investigate the economic-statistical design method for the 2-of-2 runs rule and the 2-of-3 runs rule. The Markov chain approach is used to obtain the average run length and the process cycle time. In addition, a simplified algorithm is presented to search the optimal setting of the design parameters. A numerical example and sensitivity analysis are also provided to compare the performances of the runs rules. The results show that the use of runs rule scheme can reduce operating cost comparing with the Shewhart control chart while maintaining a good statistical performance. Copyright (C) 2008 John Wiley & Sons, Ltd.-
dc.language.isoen-
dc.publisherJOHN WILEY & SONS LTD-
dc.subjecteconomic-statistical design-
dc.subjectMarkov chain approach-
dc.subjectaverage run length-
dc.subjectruns rule-
dc.subjectaverage time to signal-
dc.titleEconomic-statistical Design of 2-of-2 and 2-of-3 Runs Rule Scheme-
dc.typeArticle-
dc.contributor.AlternativeAuthor김영복-
dc.contributor.AlternativeAuthor홍정식-
dc.contributor.AlternativeAuthor이창훈-
dc.identifier.doi10.1002/qre.963-
dc.citation.journaltitleQUALITY AND RELIABILITY ENGINEERING INTERNATIONAL-
dc.description.citedreferenceACOSTAMEJIA CA, 2007, QUALITY ENG, V19, P129, DOI 10.1080/17513470701263641-
dc.description.citedreferenceKHOO MBC, 2006, QUALITY ENG, V18, P173, DOI 10.1080/08982110600567517-
dc.description.citedreferenceKlein M, 2000, J QUAL TECHNOL, V32, P427-
dc.description.citedreferenceZhang GQ, 1997, COMPUT IND ENG, V32, P575-
dc.description.citedreferencePrabhu SS, 1997, INT J PROD ECON, V49, P1-
dc.description.citedreferenceRunger GC, 1996, J AM STAT ASSOC, V91, P1701-
dc.description.citedreferenceHURWITZ AM, 1992, QUALITY ENG, V5, P21-
dc.description.citedreferenceLUCAS JM, 1990, TECHNOMETRICS, V32, P1-
dc.description.citedreferenceSANIGA EM, 1989, TECHNOMETRICS, V31, P313-
dc.description.citedreferenceCHAMP CW, 1987, TECHNOMETRICS, V29, P393-
dc.description.citedreferenceLORENZEN TJ, 1986, TECHNOMETRICS, V28, P3-
dc.description.citedreferenceDUNCAN AJ, 1986, QUALITY CONTROL IND-
dc.description.citedreferenceWHEELER DJ, 1983, J QUAL TECHNOL, V15, P155-
dc.description.citedreferenceBROOK D, 1972, BIOMETRIKA, V59, P539-
dc.description.citedreferenceTAYLOR HM, 1968, TECHNOMETRICS, V10, P479-
dc.description.citedreferenceDUNCAN AJ, 1956, J AM STAT ASSOC, V51, P228-
dc.description.tc1-
dc.identifier.wosid000263727600007-
Appears in Collections:
College of Engineering/Engineering Practice School (공과대학/대학원)Dept. of Industrial Engineering (산업공학과)Journal Papers (저널논문_산업공학과)
Files in This Item:
There are no files associated with this item.
  • mendeley

Items in S-Space are protected by copyright, with all rights reserved, unless otherwise indicated.

Browse