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Application of the Blister Test to Assess Reliability of Polyimide Based Retinal Electrode

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Authors

Lee, Seung Woo; Kim, Eui Tae; Kim, Sung June

Issue Date
2007-05-06
Citation
2007 ARVO Annual Meeting, Fort Lauderdale, Florida, 6-10 May, 2007
Keywords
678 retina730 transplantation
Language
English
URI
https://hdl.handle.net/10371/7859
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