Browse

Application of the Blister Test to Assess Reliability of Polyimide Based Retinal Electrode

Cited 0 time in Web of Science Cited 0 time in Scopus
Authors
Lee, Seung Woo; Kim, Eui Tae; Kim, Sung June
Issue Date
2007-05-06
Citation
2007 ARVO Annual Meeting, Fort Lauderdale, Florida, 6-10 May, 2007
Keywords
678 retina730 transplantation
Language
English
URI
https://hdl.handle.net/10371/7859
Files in This Item:
Appears in Collections:
College of Engineering/Engineering Practice School (공과대학/대학원)Dept. of Electrical and Computer Engineering (전기·정보공학부)Others_전기·정보공학부
  • mendeley

Items in S-Space are protected by copyright, with all rights reserved, unless otherwise indicated.

Browse