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신경보철의 안전성을 높이는 전기자극 회로의 개발

DC Field Value Language
dc.contributor.author전태호-
dc.contributor.author이중재-
dc.contributor.author김남기-
dc.contributor.author김성준-
dc.date.accessioned2009-09-15T07:03:04Z-
dc.date.available2009-09-15T07:03:04Z-
dc.date.issued2009-02-18-
dc.identifier.citation제16회 한국반도체학술대회, 대전, 2008년 2월 18-20일en
dc.identifier.urihttps://hdl.handle.net/10371/9319-
dc.description.sponsorshipThis paper was supported by the Korea Science and Engineering Foundation (KOSEF) through the Nano Bioelectronics and Systems Research Center (NBS-ERC) at Seoul National University, and by a grant from the Korea Health 21 R&D Project (A050251), Ministry of Health & Welfare, Republic of Korea and the IC Design Education Center (IDEC).en
dc.language.isokoen
dc.title신경보철의 안전성을 높이는 전기자극 회로의 개발en
dc.typeConference Paperen
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