S-Space

Browse

Author

Showing results 1 to 1 of 1

Issue Date	Title / Author(s) / Citation	File	Altmetrics
2017-11	Ranking process parameter association with low yield wafers using spec-out event network analysis Yang, Jiwon; Lee, Seungkyung; Kang, Seokho; Cho, Sungzoon; Lee, Younghak; Park, Haesang Computers and Industrial Engineering, Vol.113, pp.419-424	DOI