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Issue DateTitle / Author(s) / CitationFileAltmetrics
2020
High-Impedance, Broadband and Compact RMS Detectors for On-Chip Measurements of Millimeter Wave Voltages for Built-In Self-Testing and Debugging

Kshattry, S.; Yu, C-K; Wu, C-L; Yun, Y.; Lee, C.; Cha, C-Y; Choi, W-Y; Preisler, N.

2020 IEEE 20TH TOPICAL MEETING ON SILICON MONOLITHIC INTEGRATED CIRCUITS IN RF SYSTEMS (SIRF), pp.22-25

DOI
1