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Issue Date	Title / Author(s) / Citation	File	Altmetrics
2017-02	Drain-current Modeling of Sub-70-nm PMOSFETs Dependent on Hot- carrier Stress Bias Conditions Lim, In Eui; Jhon, Heesauk; Yoon, Gyuhan; Choi, Woo Young JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, Vol.17 No.1, pp.94-100	DOI
2018-04	On-current Modeling of 70-nm PMOSFETs Dependent on Hot-carrier Stress Bias Conditions Choi, Woo Young; Lim, In Eui; Jhon, Heesauk; Yoon, Gyuhan JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, Vol.18 No.2, pp.131-138	DOI