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Issue DateTitle / Author(s) / CitationFileAltmetrics
2023

Shin, Yuhwan; Jo, Yongwoo; Kim, Juyeop; Lee, Junseok; Kim, Jongwha; Choi, Jaehyouk

Digest of Technical Papers - IEEE International Solid-State Circuits Conference, Vol.2023-February, pp.408-410

DOI
1