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Issue Date	Title / Author(s) / Citation	File	Altmetrics
2019-06	Effect of Device Scaling on Lateral Migration Mechanism of Electrons in V-NAND Woo, Changbeom; Kim, Shinkeun; Park, Jaeyeol; Shin, Hyungcheol 2019 SILICON NANOELECTRONICS WORKSHOP (SNW), pp.27-28	DOI
2022-07	The Variation of Schottky Barrier Height Induced by the Phase Separation of InAlAs Layers on InP HEMT Devices Lee, Sang-Tae; Kong, Minwoo; Jang, Hyunchul; Song, Chang-Hun; Kim, Shinkeun; Yun, Do-Young; Jeong, Hyeon-Seok; Kim, Dae-Hyun; Shin, Chan-Soo; Seo, Kwang-Seok Crystals, Vol.12 No.7	DOI