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Issue DateTitle / Author(s) / CitationFileAltmetrics
2007-09
An embedded 8-bit RISC controller for yield enhancement of the 90-nm PRAM

Kim, Hyejung; Sohn, Kyornin; Yoo, Jerald; Yoo, Hoi-Jun

PROCEEDINGS OF THE IEEE 2007 CUSTOM INTEGRATED CIRCUITS CONFERENCE, p. 4405847
1