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A Study on the Effect of the Structural Parameters and Internal Mechanism of a Bilateral Gate-Controlled S/D Symmetric and Interchangeable Bidirectional Tunnel Field Effect Transistor

Cited 2 time in Web of Science Cited 2 time in Scopus
Authors

Jin, Xiaoshi; Wang, Yicheng; Ma, Kailu; Wu, Meile; Liu, Xi; Lee, Jong-Ho

Issue Date
2021-06-08
Publisher
Springer Open
Citation
Nanoscale Research Letters. 2021 Jun 08;16(1):102
Keywords
Tunnel feld efect transistorCMOS, Bidirectional switchSubthreshold swingNanoscale
Abstract
A bilateral gate-controlled S/D symmetric and interchangeable bidirectional tunnel field effect transistor (B-TFET) is proposed in this paper, which shows the advantage of bidirectional switching characteristics and compatibility with CMOS integrated circuits compared to the conventional asymmetrical TFET. The effects of the structural parameters, e.g., the doping concentrations of the N+ region and P+ region, length of the N+ region and length of the intrinsic region, on the device performances, e.g., the transfer characteristics, Ion–Ioff ratio and subthreshold swing, and the internal mechanism are discussed and explained in detail.
ISSN
1556-276X
Language
English
URI
https://hdl.handle.net/10371/174790
DOI
https://doi.org/10.1186/s11671-021-03561-8
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