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Origin of cathodic degradation and new phase formation at the La0.9Sr0.1MnO3/YSZ interface

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Authors
Lee, Hee Y.; Oh, Seung M.
Issue Date
1999-02-12
Publisher
Elsevier
Citation
Solid State Ionics 90 (1996) 133
Keywords
Lanthanum zirconateCathode degradation in SOFCOhmic lossesAC impedanceCurrent interruption
Abstract
New phase formation at the La0.9Sr0.1MnO3/YSZ interface and its effects on the cathodic performances were studied at 900 °C in air. The resistance caused by the interfacial product layer kept increasing with time to reach up to 40% of the total resistance after 500 h. The interfacial product was identified as La2Zr2O7 by XRD measurement. The electrical conductivity of La2Zr2O7 (2.4 × 10−5 S cm−1 at 1000 °C), measured by AC impedance and current interruption methods, was 4 to 7 orders of magnitude smaller than those of La0.9Sr0.1MnO3 electrode or YSZ electrolyte. Either the electronic conductivity or the electrochemical O2 reduction activity of La2Zr2O7 was negligible. Combining these results, a conclusion was made that the cathodic degradation comes mainly from the growth of interfacial product layer and its contribution to the cell resistance increment is ohmic in nature.
ISSN
0167-2738
Language
English
URI
http://hdl.handle.net/10371/5649
DOI
https://doi.org/10.1016/S0167-2738(96)00408-0

https://doi.org/10.1016/S0167-2738(96)00408-0
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College of Engineering/Engineering Practice School (공과대학/대학원)Dept. of Chemical and Biological Engineering (화학생물공학부)Journal Papers (저널논문_화학생물공학부)
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