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Issue Date Title / Author(s) / CitationFileAltmetrics
2009-08
Comparative Study of the Low-Frequency-Noise Behaviors in a-IGZO Thin-Film Transistors With Al2O3 and Al2O3/SiNx Gate Dielectrics

Cho, In-Tak; Cheong, Woo-Seok; Hwang, Chi-Sun; Lee, Jeong-Min; Kwon, Hyuck-In; Lee, Jong-Ho

IEEE Electron Device Letters, vol. 30, no. 8, pp. 828~830

DOI
1

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