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Issue Date	Title / Author(s) / Citation	File	Altmetrics
2016-08	Elimination of the gate and drain bias stresses in I-V characteristics of WSe2 FETs by using dual channel pulse measurement Park, Jun-Mo; Cho, In-Tak; Kang, Won-Mook; Park, Byung-Gook; Lee, Jong-Ho Applied Physics Letters, Vol.109 No.5, p. 053503	DOI
2019-09	Review of candidate devices for neuromorphic applications Lee, Jong-Ho; Woo, Sung Yun; Lee, Sung-Tae; Lim, Suhwan; Kang, Won-Mook; Seo, Young-Tak; Lee, Soochang; Kwon, Dongseok; Oh, Seongbin; Noh, Yoohyun; Kim, Hyeongsu; Kim, Jangsaeng; Bae, Jong-Ho 49TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE (ESSDERC 2019), pp.22-27	DOI