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Issue Date	Title / Author(s) / Citation	File	Altmetrics
2023-02	Recovery of off-state stress-induced damage in FET-type gas sensor using self-curing method Shin, Wonjun; Jeong, Yujeong; Kim, Mingyu; Lee, Jungsoo; Koo, Ryun-Han; Hong, Seongbin; Jung, Gyuweon; Kim, Jae-Joon; Lee, Jong-Ho Nanoscale Research Letters, Vol.18 No.1, p. 11671	DOI
2023-02	Recovery of off-state stress-induced damage in FET-type gas sensor using self-curing method Shin, Wonjun; Jeong, Yujeong; Kim, Mingyu; Lee, Jungsoo; Koo, Ryun-Han; Hong, Seongbin; Jung, Gyuweon; Kim, Jae-Joon; Lee, Jong-Ho Discover Nano, 18(1):24	view file DOI