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Showing results 1 to 4 of 4

Issue DateTitle / Author(s) / CitationFileAltmetrics
2019-01

Park, Heechun; Kim, Taewhan

Integration, the VLSI Journal, Vol.64, pp.29-39

DOI
2021

Jeong, Eunsol; Park, Heechun; Jeong, Jooyeon; Kim, Taewhan

2021 IEEE INTERNATIONAL MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS (MWSCAS), pp.232-235

DOI
2021-03

Kim, Taehwan; Park, Heechun; Kim, Taewhan

IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol.29 No.3, pp.499-511

DOI
2022-03

Jeong, Eunsol; Park, Heechun; Kim, Taewhan

Proceedings -Design, Automation and Test in Europe, DATE, pp.933-938

DOI
1