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Issue Date	Title / Author(s) / Citation	File	Altmetrics
2019-04	Influence of Etch Profiles on the Leakage Current and Capacitance of 3-D DRAM Storage Capacitors Shin, Seongun; Yoon, Gyuhan; Choi, Woo Young JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, Vol.19 No.2, pp.208-213	DOI
2019-04	A Technology-Computer-Aided-Design-Based Reliability Prediction Model for DRAM Storage Capacitors Choi, Woo Young; Yoon, Gyuhan; Chung, Woo Young; Cho, Younghoon; Shin, Seongun; Ahn, Kwang Ho Micromachines, Vol.10 No.4, p. 256	DOI