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Issue Date | Title / Author(s) / Citation | File | Altmetrics |
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2004-01 | Spectroscopic ellipsometric study of ZnO and Zn1-xMgxO thin films grown on (0001) sapphire substrate J. Korean Phys. Soc. 44, 129 (2004) | view filelink | |
2020-05 | Applied Surface Science, Vol.511, p. 145503 | DOI |
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