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Design of All-Digital PLL Using Statistical Data of Bang-Bang Phase Detection : 뱅뱅 위상검출기의 통계 수치를 이용한 올 디지털 위상 동기화 루프의 설계

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Authors

장성천

Advisor
정덕균
Major
공과대학 전기·컴퓨터공학부
Issue Date
2015-08
Publisher
서울대학교 대학원
Keywords
Adaptive gain controlall-digital phase-locked loop (ADPLL)autocorrelationbang-bang phase-frequency detector (BBPFD)bang-bang phase-locked loop (BBPLL)spread spectrum clock generator (SSCG)
Description
학위논문 (박사)-- 서울대학교 대학원 : 전기·컴퓨터공학부, 2015. 8. 정덕균.
Abstract
An all-digital phase-locked loop (ADPLL) and an all-digital spread spectrum clock generator (SSCG) are proposed using the stochastic data of the bang-bang phase-frequency detection. The all-digital bang-bang PLL (BBPLL) that tracks the optimum loop gain for minimum jitter is proposed. The autocorrelation of the output of bang-bang phase frequency detector (BBPFD) indicates whether the BBPLL operates in the nonlinear regime or the random noise regime. Using the behavioral model simulation and mathematical analysis, it is shown that the output jitter is minimized when the autocorrelation of BBPFD output is zero. An adaptive loop gain controller (ALGC) continuously evaluates the autocorrelation of the BBPFD output and adjusts the loop gain to make the autocorrelation zero. The digital loop filter (DLF) operates at higher than the reference clock frequency to reduce the loop latency and to mitigate the resolution of the digitally-controlled oscillator (DCO). The prototype chip has been fabricated in a 65-nm CMOS process. It exhibits rms jitter of 1.72 ps at 2.5 GHz.
The all-digital SSCG using two-point modulation is presented. To calibrate the gain mismatch between the direct and division ratio modulation paths, a background gain calibration method is proposed. An adaptive gain controller (AGC) continuously evaluates the correlation between the modulation profile and the BBPFD output and adjusts the direct modulation gain to make the correlation zero. To reduce the power consumption and design complexity, the BBPFD is used instead of the time-to-digital converter (TDC). The prototype chip has been fabricated in a 65-nm CMOS process and it consumes 6 mW at 2.5 GHz. The measured minimum rms jitter is 1.58 ps.
Language
English
URI
https://hdl.handle.net/10371/119111
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