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Dynamic key-frame selection technique for enhanced odometry estimation based on laser scan similarity comparison

Cited 3 time in Web of Science Cited 3 time in Scopus
Authors

Yoo, W. S.; Lee, B. H.

Issue Date
2017-06
Publisher
Institute of Electrical Engineers
Citation
Electronics Letters, Vol.53 No.13, pp.852-854
Abstract
A dynamic key-frame selection technique is proposed for enhanced odometry estimation. The odometry estimation problem has a drift problem in which errors are accumulated over time. The proposed technique finds the key-frame which reduces the odometry drift for every time step based on scan similarity comparisons. The enhancement of the proposed method is verified through the performance comparison with the frame-to-frame and the conventional frame to key-frame methods.
ISSN
0013-5194
Language
English
URI
https://hdl.handle.net/10371/139299
DOI
https://doi.org/10.1049/el.2017.1346
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