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고집적 반도체용 구리 배선에서의 패턴 선폭에 따른 전기 비저항 측정

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Authors

김재훈

Advisor
한흥남
Issue Date
2008
Publisher
서울대학교 대학원
Keywords
구리copper전기 비저항resistivity선폭line width도금electroplating집속 이온 빔focused ion beam표면 거칠기roughness
Description
학위논문(석사) --서울대학교 대학원 :재료공학부,2008.2.
Language
Korean
URI
http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000041106

https://hdl.handle.net/10371/15041
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