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Program / erase / retention modeling of nitride-based charge trapping flash memory and its characterization
질화막 트래핑 플래쉬 메모리의 쓰기 / 지우기 / 유지능력 모델링과 특성 분석에 관한 연구

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Authors
김두현
Advisor
박병국
Major
전기. 컴퓨터공학부
Issue Date
2011-08
Publisher
서울대학교 대학원
Keywords
전하트랩플래시 메모리쓰기지우기유지 능력SONOS모델시뮬레이션실리콘 질화막트랩 밀도charge trapflash memoryprogrameraseretentionmodelsimulationsilicon nitridetrap density
Description
학위논문 (박사)-- 서울대학교 대학원 : 전기. 컴퓨터공학부, 2011.8. 박병국.
Language
eng
URI
http://hdl.handle.net/10371/158986

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College of Engineering/Engineering Practice School (공과대학/대학원)Dept. of Electrical and Computer Engineering (전기·정보공학부)Theses (Ph.D. / Sc.D._전기·정보공학부)
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