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Electrical Scanning Probe Microscopy on Organic Optoelectronic Structures : 전기 주사 탐침 현미경을 이용한 유기 광전 구조의 분석에 관한 연구

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Authors

Weber, Stefan

Advisor
윤도영
Major
화학부 고분자화학전공
Issue Date
2011-02
Publisher
서울대학교 대학원
Keywords
전도성 SFM켈빈탐침 원자힘현미경Scanning Probe MicroscopyKelvin Probe MicroscopyConductive Scanning Force MicroscopyOrganic Electronics
Description
학위논문 (박사)-- 서울대학교 대학원 : 화학부 고분자화학전공, 2011.2. 윤도영.
Language
eng
URI
https://hdl.handle.net/10371/159337

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