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전해질 - 산화막 - 실리콘 시스템의 터널링 전류 해석 : Analysis of tunneling current in the Electrolyte - Oxide - Silicon system

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Authors

최연규

Advisor
박영준
Major
전기. 컴퓨터공학부
Issue Date
2011-02
Publisher
서울대학교 대학원
Keywords
EOS터널링 전류EDL전기 도금산화막 열화tunneling currentElectroplatingoxide degradation
Description
학위논문 (석사)-- 서울대학교 대학원 : 전기. 컴퓨터공학부, 2011.2. 박영준.
Language
kor
URI
https://hdl.handle.net/10371/159570

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