Publications

Detailed Information

Learning of model-plant mismatch map via neural network modeling and its application to offset-free model predictive control

Cited 8 time in Web of Science Cited 10 time in Scopus
Authors

Son, Sang Hwan; Kim, Jong Woo; Oh, Tae Hoon; Jeong, Dong Hwi; Lee, Jong Min

Issue Date
2022-07
Publisher
Butterworth Scientific Ltd.
Citation
Journal of Process Control, Vol.115, pp.112-122
Abstract
We propose an improved offset-free model predictive control (MPC) framework, which learns and utilizes the intrinsic model-plant mismatch map, to effectively exploit the advantages of model based and data-driven control strategies and overcome the limitation of each approach. In this study, the model-plant mismatch map on steady-state manifold is approximated via artificial neural network (ANN) modeling based on steady-state data from the process. Though the learned model plant mismatch map can provide the information at the equilibrium point (i.e., setpoint), it cannot provide model-plant mismatch information during transient state. To handle this, we additionally apply a supplementary disturbance variable which is updated from a revised disturbance estimator considering the disturbance value obtained from the learned model-plant mismatch map. Then, the learned and supplementary disturbance variables are applied to the target problem and finite-horizon optimal control problem of the offset-free MPC framework. By this, the control system can utilize both the learned model-plant mismatch information and the stabilizing property of the nominal disturbance estimator. The closed-loop simulation results demonstrate that the proposed offset-free MPC scheme utilizing the model-plant mismatch map learned via ANN modeling efficiently improves the closed-loop reference tracking performance of the control system. Additionally, the zero-offset tracking condition of the developed framework is mathematically examined. (C) 2022 Elsevier Ltd. All rights reserved.
ISSN
0959-1524
URI
https://hdl.handle.net/10371/184266
DOI
https://doi.org/10.1016/j.jprocont.2022.04.014
Files in This Item:
There are no files associated with this item.
Appears in Collections:

Altmetrics

Item View & Download Count

  • mendeley

Items in S-Space are protected by copyright, with all rights reserved, unless otherwise indicated.

Share