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Dual random circuit breaker network model with equivalent thermal circuit network
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Kwanyong | - |
dc.contributor.author | Yoon, Seong Jun | - |
dc.contributor.author | Choi, Woo Young | - |
dc.date.accessioned | 2022-10-26T07:21:44Z | - |
dc.date.available | 2022-10-26T07:21:44Z | - |
dc.date.created | 2022-10-20 | - |
dc.date.issued | 2014-01 | - |
dc.identifier.citation | Applied Physics Express, Vol.7 No.2, p. 024203 | - |
dc.identifier.issn | 1882-0778 | - |
dc.identifier.uri | https://hdl.handle.net/10371/186805 | - |
dc.description.abstract | A SPICE-based dual random circuit breaker (RCB) network model with an equivalent thermal circuit network has been proposed in order to emulate resistance switching (RS) of unipolar resistive random access memory (RRAM). The dual RCB network model consists of the electrical RCB network model for the forming and set operations and the equivalent thermal circuit network model for the reset operation. In addition, the proposed model can explain the effects of heat dissipation on the memory and threshold RS with the variation in electrode thickness. (C) 2014 The Japan Society of Applied Physics | - |
dc.language | 영어 | - |
dc.publisher | Japan Soc of Applied Physics | - |
dc.title | Dual random circuit breaker network model with equivalent thermal circuit network | - |
dc.type | Article | - |
dc.identifier.doi | 10.7567/APEX.7.024203 | - |
dc.citation.journaltitle | Applied Physics Express | - |
dc.identifier.wosid | 000331454000033 | - |
dc.identifier.scopusid | 2-s2.0-84893240560 | - |
dc.citation.number | 2 | - |
dc.citation.startpage | 024203 | - |
dc.citation.volume | 7 | - |
dc.description.isOpenAccess | N | - |
dc.contributor.affiliatedAuthor | Choi, Woo Young | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
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