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Thickness and temperature dependency of variation of dielectric functions of phase-change VO2 film
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Sun-Je | - |
| dc.contributor.author | Choi, Sungwook | - |
| dc.contributor.author | Sung, Jangwoon | - |
| dc.contributor.author | Lee, Yong Wook | - |
| dc.contributor.author | Lee, Byoungho | - |
| dc.date.accessioned | 2022-10-26T07:22:17Z | - |
| dc.date.available | 2022-10-26T07:22:17Z | - |
| dc.date.created | 2022-10-21 | - |
| dc.date.issued | 2018-07 | - |
| dc.identifier.citation | 23RD OPTO-ELECTRONICS AND COMMUNICATIONS CONFERENCE (OECC2018) | - |
| dc.identifier.issn | 2166-8884 | - |
| dc.identifier.uri | https://hdl.handle.net/10371/186852 | - |
| dc.description.abstract | In this paper, temperature-and thickness-dependent variation of dielectric functions of VO2 film deposited by pulsed-laser deposition is characterized at both insulating and metallic phases by ellipsometry. | - |
| dc.language | 영어 | - |
| dc.publisher | IEEE | - |
| dc.title | Thickness and temperature dependency of variation of dielectric functions of phase-change VO2 film | - |
| dc.type | Article | - |
| dc.citation.journaltitle | 23RD OPTO-ELECTRONICS AND COMMUNICATIONS CONFERENCE (OECC2018) | - |
| dc.identifier.wosid | 000477695500038 | - |
| dc.description.isOpenAccess | N | - |
| dc.contributor.affiliatedAuthor | Lee, Byoungho | - |
| dc.type.docType | Proceedings Paper | - |
| dc.description.journalClass | 1 | - |
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