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A Fully Integrated 700mA Event-Driven Digital Low-Dropout Regulator with Residue-Tracking Loop for Fine-Grained Power Management Unit
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Park, Jun-Eun | - |
dc.contributor.author | Jeong, Deog-Kyoon | - |
dc.date.accessioned | 2022-10-26T07:22:20Z | - |
dc.date.available | 2022-10-26T07:22:20Z | - |
dc.date.created | 2022-10-21 | - |
dc.date.issued | 2018-06 | - |
dc.identifier.citation | 2018 IEEE SYMPOSIUM ON VLSI CIRCUITS, pp.231-232 | - |
dc.identifier.uri | https://hdl.handle.net/10371/186856 | - |
dc.description.abstract | This paper presents a fully integrated digital low-dropout regulator (LDO). A proposed event-driven digital control based on a residue-tracking loop provides not only a heavy load capacity of 700mA but also an accurate regulation. A latch-based shift register is adopted to improve the digital regulation against a large load current change. The proposed LDO embedding an on-chip 100pF output capacitor was fabricated in a 65nm LP CMOS process. The LDO provides a load regulation of 0.1mV/mA and an output voltage error below 1.1% across a range from 0.5 to 1V. The LDO achieves a figure-of-merit (FOM) of 6.74fs. | - |
dc.language | 영어 | - |
dc.publisher | IEEE | - |
dc.title | A Fully Integrated 700mA Event-Driven Digital Low-Dropout Regulator with Residue-Tracking Loop for Fine-Grained Power Management Unit | - |
dc.type | Article | - |
dc.identifier.doi | 10.1109/VLSIC.2018.8502295 | - |
dc.citation.journaltitle | 2018 IEEE SYMPOSIUM ON VLSI CIRCUITS | - |
dc.identifier.wosid | 000853983300092 | - |
dc.identifier.scopusid | 2-s2.0-85056905974 | - |
dc.citation.endpage | 232 | - |
dc.citation.startpage | 231 | - |
dc.description.isOpenAccess | N | - |
dc.contributor.affiliatedAuthor | Jeong, Deog-Kyoon | - |
dc.type.docType | Proceedings Paper | - |
dc.description.journalClass | 1 | - |
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