Publications

Detailed Information

Scene text rectification using glyph and character alignment properties

DC Field Value Language
dc.contributor.authorKil, Taeho-
dc.contributor.authorKoo, Hyung Il-
dc.contributor.authorCho, Nam Ik-
dc.date.accessioned2022-10-26T07:22:42Z-
dc.date.available2022-10-26T07:22:42Z-
dc.date.created2022-10-24-
dc.date.issued2018-08-
dc.identifier.citation2018 24TH INTERNATIONAL CONFERENCE ON PATTERN RECOGNITION (ICPR), pp.3663-3668-
dc.identifier.issn1051-4651-
dc.identifier.urihttps://hdl.handle.net/10371/186887-
dc.description.abstractScene text images usually suffer from perspective distortions, and hence their rectification has been an essential pre-processing step for many applications. Existing methods for scene text rectification mainly exploited the glyph property, which means that the characters in many languages have horizontal/vertical strokes and also have some symmetries in their shapes. In this paper, we propose to use an additional property that the characters need to be well aligned when rectified. For this, character alignment, as well as glyph properties, are encoded in the proposed cost function, and its minimization generates the transformation parameters. For encoding the alignment constraints, we perform the character segmentation using a projection profile method before optimizing the cost function. Since better segmentation needs better rectification and vice versa, the overall algorithm is designed to perform character segmentation and rectification iteratively. We evaluate our method on real and synthetic scene text images, and the experimental results show that our method achieves higher optical character recognition (OCR) rate than the previous approaches and also yields visually pleasing results.-
dc.language영어-
dc.publisherIEEE-
dc.titleScene text rectification using glyph and character alignment properties-
dc.typeArticle-
dc.identifier.doi10.1109/ICPR.2018.8546060-
dc.citation.journaltitle2018 24TH INTERNATIONAL CONFERENCE ON PATTERN RECOGNITION (ICPR)-
dc.identifier.wosid000455146803111-
dc.identifier.scopusid2-s2.0-85059769760-
dc.citation.endpage3668-
dc.citation.startpage3663-
dc.description.isOpenAccessN-
dc.contributor.affiliatedAuthorCho, Nam Ik-
dc.type.docTypeProceedings Paper-
dc.description.journalClass1-
Appears in Collections:
Files in This Item:
There are no files associated with this item.

Altmetrics

Item View & Download Count

  • mendeley

Items in S-Space are protected by copyright, with all rights reserved, unless otherwise indicated.

Share