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Dynamic Slingshot Operation for Low-Operation-Voltage Nanoelectromechanical (NEM) Memory Switches

DC Field Value Language
dc.contributor.authorKang, Min Hee-
dc.contributor.authorChoi, Woo Young-
dc.date.accessioned2022-10-26T07:23:00Z-
dc.date.available2022-10-26T07:23:00Z-
dc.date.created2022-10-19-
dc.date.issued2020-04-
dc.identifier.citationIEEE Access, Vol.8, pp.65683-65688-
dc.identifier.issn2169-3536-
dc.identifier.urihttps://hdl.handle.net/10371/186914-
dc.description.abstractA dynamic slingshot pull-in operation is presented by using the influence of inertia and damping on the nanoelectromechanical (NEM) memory switch operation. To confirm the validity of the proposed idea, a finite element analysis (FEA) simulation, that reflects the actual cantilever beam structure, is performed, and an analytical one-dimensional (1D), the parallel plate model is tested. According to the analytical and FEA data, the dynamic slingshot pull-in voltage can be achieved similar to 0.78 times and similar to 0.73 times lower than conventional pull-in voltage under near-vacuum conditions, respectively. It is also shown that the proposed dynamic slingshot operation is more effective for lowering operation voltage (V-DD) and boosting the chip density of complementary-metal-oxide-semiconductor (CMOS)- NEM hybrid reconfigurable logic (RL) circuits than the static slingshot operation.-
dc.language영어-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.titleDynamic Slingshot Operation for Low-Operation-Voltage Nanoelectromechanical (NEM) Memory Switches-
dc.typeArticle-
dc.identifier.doi10.1109/ACCESS.2020.2985105-
dc.citation.journaltitleIEEE Access-
dc.identifier.wosid000530836000014-
dc.identifier.scopusid2-s2.0-85083731809-
dc.citation.endpage65688-
dc.citation.startpage65683-
dc.citation.volume8-
dc.description.isOpenAccessN-
dc.contributor.affiliatedAuthorChoi, Woo Young-
dc.type.docTypeArticle-
dc.description.journalClass1-
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