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Kelvin Inductance and Resistance Measurements Using an AC Source and DC Voltmeters
DC Field | Value | Language |
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dc.contributor.author | Choi, Wooyeol | - |
dc.contributor.author | Kenneth, K. O. | - |
dc.date.accessioned | 2024-04-30T01:22:06Z | - |
dc.date.available | 2024-04-30T01:22:06Z | - |
dc.date.created | 2024-04-29 | - |
dc.date.created | 2024-04-29 | - |
dc.date.issued | 2016 | - |
dc.identifier.citation | 2016 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM (IMS), Vol.2016-August | - |
dc.identifier.issn | 0149-645X | - |
dc.identifier.uri | https://hdl.handle.net/10371/199981 | - |
dc.description.abstract | Kelvin measurements of series inductance and resistance of an on-chip inductor at frequencies from 5 to 10 GHz is demonstrated using a CMOS process. The measurements require 3 DC voltage meters, 3 DC current sources, an AC signal source, and one high frequency probe. The resistance is lower and within 0.5 Omega of that from a calibrated measurement using a vector network analyzer (VNA), while the inductance is 10% (50 pH) lower. Due to the reduction of the variability of contacts, the range of series resistance variation measured using the proposed technique is 2 to 5 times lower than that using a VNA. 3-D electromagnetic simulations suggest that the inductance measured using the proposed Kelvin technique is more accurate due to the elimination of de-embedding errors. | - |
dc.language | 영어 | - |
dc.publisher | IEEE | - |
dc.title | Kelvin Inductance and Resistance Measurements Using an AC Source and DC Voltmeters | - |
dc.type | Article | - |
dc.identifier.doi | 10.1109/MWSYM.2016.7540355 | - |
dc.citation.journaltitle | 2016 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM (IMS) | - |
dc.identifier.wosid | 000390313200414 | - |
dc.identifier.scopusid | 2-s2.0-84984972819 | - |
dc.citation.volume | 2016-August | - |
dc.description.isOpenAccess | N | - |
dc.contributor.affiliatedAuthor | Choi, Wooyeol | - |
dc.type.docType | Proceedings Paper | - |
dc.description.journalClass | 1 | - |
dc.subject.keywordAuthor | CMOS | - |
dc.subject.keywordAuthor | Kelvin measurements | - |
dc.subject.keywordAuthor | RMS detectors | - |
dc.subject.keywordAuthor | on-chip inductors | - |
dc.subject.keywordAuthor | on-chip measurements | - |
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- College of Engineering
- Department of Electrical and Computer Engineering
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