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Terahertz Imaging Circuits in CMOS
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Ahmad, Zeshan | - |
dc.contributor.author | Kim, Dae-Yeon | - |
dc.contributor.author | Han, Ruonan | - |
dc.contributor.author | Choi, Wooyeol | - |
dc.contributor.author | Kenneth, K. O. | - |
dc.date.accessioned | 2024-04-30T01:22:37Z | - |
dc.date.available | 2024-04-30T01:22:37Z | - |
dc.date.created | 2024-04-26 | - |
dc.date.created | 2024-04-26 | - |
dc.date.issued | 2015 | - |
dc.identifier.citation | 2015 ASIA-PACIFIC MICROWAVE CONFERENCE (APMC), VOLS 1-3, Vol.1 | - |
dc.identifier.uri | https://hdl.handle.net/10371/199991 | - |
dc.description.abstract | An 820-GHz 8x8 imaging array of diode-connected NMOS transistor detectors, and 5-, and 10-THz fundamental Schottky diode detectors are demonstrated in a 130-nm bulk CMOS process. Measured mean optical responsivity (R-v) of 2.6kV/W and mean optical NEP of 36pW/Hz(1/2) at a modulation frequency of 1MHz are achieved for the 820-GHz imaging array. The NEP is more than 2.5X lower than that of the previously reported NMOS terahertz imaging arrays. The fundamental electronic detection of Far-Infrared radiation up to 9.74THz is also reported. A peak R-v of 383 at 4.92THz and a peak R-v of 14V/W at 9.74THz have been measured using a free electron laser. The R-v at 9.74THz is 14X of that for the previously reported highest frequency electronic detection. The shot noise limited NEP at 4.92 and 9.74THz is similar to 0.43 and similar to 2nW/root Hz, respectively | - |
dc.language | 영어 | - |
dc.publisher | IEEE | - |
dc.title | Terahertz Imaging Circuits in CMOS | - |
dc.type | Article | - |
dc.identifier.doi | 10.1109/APMC.2015.7411757 | - |
dc.citation.journaltitle | 2015 ASIA-PACIFIC MICROWAVE CONFERENCE (APMC), VOLS 1-3 | - |
dc.identifier.wosid | 000382378800162 | - |
dc.identifier.scopusid | 2-s2.0-84978087140 | - |
dc.citation.volume | 1 | - |
dc.description.isOpenAccess | N | - |
dc.contributor.affiliatedAuthor | Choi, Wooyeol | - |
dc.type.docType | Proceedings Paper | - |
dc.description.journalClass | 1 | - |
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- College of Engineering
- Department of Electrical and Computer Engineering
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