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A Diagnosable Network-on-Chip for FPGA Verification of Intellectual Properties
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Han, Kyuseung | - |
dc.contributor.author | Lee, Jae-Jin | - |
dc.contributor.author | Lee, Woojoo | - |
dc.contributor.author | Lee, Jinho | - |
dc.date.accessioned | 2024-05-02T06:01:08Z | - |
dc.date.available | 2024-05-02T06:01:08Z | - |
dc.date.created | 2024-04-23 | - |
dc.date.created | 2024-04-23 | - |
dc.date.created | 2024-04-23 | - |
dc.date.issued | 2019-03 | - |
dc.identifier.citation | IEEE Design and Test, Vol.36 No.2, pp.81-87 | - |
dc.identifier.issn | 2168-2356 | - |
dc.identifier.uri | https://hdl.handle.net/10371/200534 | - |
dc.description.abstract | Editor's note: Debug and validation are important steps required to ensure that systems-on-chip satisfies the design specs. This article presents an elegant diagnosis technique integrated within the network-on-chip infrastructure. The authors demonstrate the proposed technique on an FPGA prototype.-Umit Y. Ogras, Arizona State University | - |
dc.language | 한국어 | - |
dc.publisher | IEEE Computer Society | - |
dc.title | A Diagnosable Network-on-Chip for FPGA Verification of Intellectual Properties | - |
dc.type | Article | - |
dc.identifier.doi | 10.1109/MDAT.2018.2890238 | - |
dc.citation.journaltitle | IEEE Design and Test | - |
dc.identifier.wosid | 000464913400007 | - |
dc.identifier.scopusid | 2-s2.0-85059419870 | - |
dc.citation.endpage | 87 | - |
dc.citation.number | 2 | - |
dc.citation.startpage | 81 | - |
dc.citation.volume | 36 | - |
dc.description.isOpenAccess | N | - |
dc.contributor.affiliatedAuthor | Lee, Jinho | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.subject.keywordAuthor | debugging | - |
dc.subject.keywordAuthor | FPGA verification | - |
dc.subject.keywordAuthor | Network-on-chip | - |
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- College of Engineering
- Department of Electrical and Computer Engineering
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