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Thickness-dependent Schottky barrier height of MoS2 field-effect transistors

Cited 116 time in Web of Science Cited 116 time in Scopus
Authors

Kwon, Junyoung; Lee, Jong-Young; Yu, Young-Jun; Lee, Chul-Ho; Cui, Xu; Honed, James; Lee, Gwan-Hyoung

Issue Date
2017-05
Publisher
Royal Society of Chemistry
Citation
Nanoscale, Vol.9 No.18, pp.6151-6157
Abstract
2D semiconductors, including transition metal dichalcogenides (TMDs), have been widely studied recently. However, the device performance is deteriorated due to the significant contact resistance. The contact resistance of MoS2-metal contacts decreases with the thickness of MoS2. We obtained a Schottky barrier height as low as about 70 meV when MoS2 is trilayer-thick. It is important to find the optimal choice of contact metal and layer thickness of MoS2.
ISSN
2040-3364
URI
https://hdl.handle.net/10371/202111
DOI
https://doi.org/10.1039/c7nr01501a
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  • College of Engineering
  • Department of Electrical and Computer Engineering
Research Area 2차원 반도체 소자 및 재료, High-Performance 2D Electronics, Low-Power 2D Electronics, 뉴로모픽 소자 및 응용기술, 저전력 소자 및 소자물리

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