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Visualizing Grain Statistics in MOCVD WSe2 through Four-Dimensional Scanning Transmission Electron Microscopy
Cited 7 time in
Web of Science
Cited 9 time in Scopus
- Authors
- Issue Date
- 2022-03
- Publisher
- American Chemical Society
- Citation
- Nano Letters, Vol.22 No.6, pp.2578-2585
- Abstract
- Using four-dimensional scanning transmission electron microscopy, we demonstrate a method to visualize grains and grain boundaries in WSe2 grown by metal organic chemical vapor deposition (MOCVD) directly onto silicon dioxide. Despite the chemical purity and uniform thickness and texture of the MOCVD-grown WSe2, we observe a high density of small grains that corresponds with the overall selenium deficiency we measure through ion beam analysis. Moreover, reconstruction of grain information permits the creation of orientation maps that demonstrate the nucleation mechanism for new layers-triangular domains with the same orientation as the layer underneath induces a tensile strain increasing the lattice parameter at these sites.
- ISSN
- 1530-6984
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Related Researcher
- College of Engineering
- Department of Electrical and Computer Engineering
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