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Temperature dependence of optical properties of monolayer WS2 by spectroscopic ellipsometry
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Hoang Tung Nguyen | - |
dc.contributor.author | Kim, Tae Jung | - |
dc.contributor.author | Park, Han Gyeol | - |
dc.contributor.author | Van Long Le | - |
dc.contributor.author | Nguyen, Xuan Au | - |
dc.contributor.author | Koo, Dohyoung | - |
dc.contributor.author | Lee, Chul-Ho | - |
dc.contributor.author | Cuong, Do Duc | - |
dc.contributor.author | Hong, Soon Cheol | - |
dc.contributor.author | Kim, Young Dong | - |
dc.date.accessioned | 2024-05-16T01:10:50Z | - |
dc.date.available | 2024-05-16T01:10:50Z | - |
dc.date.created | 2023-04-19 | - |
dc.date.issued | 2020-05 | - |
dc.identifier.citation | Applied Surface Science, Vol.511, p. 145503 | - |
dc.identifier.issn | 0169-4332 | - |
dc.identifier.uri | https://hdl.handle.net/10371/202252 | - |
dc.description.abstract | The complex dielectric function epsilon = epsilon(1) + i epsilon(2) of monolayer tungsten disulfide (WS2) is investigated for the energy range from 1.5 to 6.0 eV and temperatures from 41 to 300 K. Measurements were performed under ultra-high vacuum conditions to avoid degradation and overlayer contamination. Fourteen critical-point (CP) energies were observed and their origins in Brillouin-zone were identified by band structure calculations. At low temperature the A and B excitonic peaks split into four CPs, which is understood as the neutral and charged exciton states of monolayer WS2. At low temperatures the CP energies show blue shifts with enhanced structure due to the reduction of electron-phonon interaction. The temperature dependence of these data was obtained by a phenomenological expression with Bose-Einstein statistical factor. | - |
dc.language | 영어 | - |
dc.publisher | Elsevier BV | - |
dc.title | Temperature dependence of optical properties of monolayer WS2 by spectroscopic ellipsometry | - |
dc.type | Article | - |
dc.identifier.doi | 10.1016/j.apsusc.2020.145503 | - |
dc.citation.journaltitle | Applied Surface Science | - |
dc.identifier.wosid | 000517883800090 | - |
dc.identifier.scopusid | 2-s2.0-85079012558 | - |
dc.citation.startpage | 145503 | - |
dc.citation.volume | 511 | - |
dc.description.isOpenAccess | N | - |
dc.contributor.affiliatedAuthor | Lee, Chul-Ho | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.subject.keywordPlus | ELECTRONIC-STRUCTURE | - |
dc.subject.keywordPlus | CRITICAL-POINTS | - |
dc.subject.keywordPlus | LIGHT-EMISSION | - |
dc.subject.keywordPlus | MONO LAYER | - |
dc.subject.keywordPlus | MOS2 | - |
dc.subject.keywordPlus | DYNAMICS | - |
dc.subject.keywordPlus | EXCITONS | - |
dc.subject.keywordPlus | PHOTOLUMINESCENCE | - |
dc.subject.keywordPlus | SAPPHIRE | - |
dc.subject.keywordPlus | SHEETS | - |
dc.subject.keywordAuthor | Spectroscopic ellipsometry | - |
dc.subject.keywordAuthor | Monolayer tungsten disulphide (WS2) | - |
dc.subject.keywordAuthor | Dielectric function | - |
dc.subject.keywordAuthor | Exciton | - |
dc.subject.keywordAuthor | Critical point | - |
dc.subject.keywordAuthor | Temperature dependence | - |
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- College of Engineering
- Department of Electrical and Computer Engineering
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