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Han, Kyuseung; Lee, Jae-Jin; Lee, Woojoo; Lee, Jinho
IEEE Design and Test, Vol.36 No.2, pp.81-87
Kshattry, S.; Yu, C-K; Wu, C-L; Yun, Y.; Lee, C.; Cha, C-Y; Choi, W-Y; Preisler, N.
2020 IEEE 20TH TOPICAL MEETING ON SILICON MONOLITHIC INTEGRATED CIRCUITS IN RF SYSTEMS (SIRF), pp.22-25