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Issue Date	Title / Author(s) / Citation	File	Altmetrics
2008-04	Low-frequency noise characterization of ZnO nanorod back-gate field-effect transistor structure Lee, Jungil; Yu, Byung-Yong; Lee, Chul Ho; Yi, Gyu-Chul; Son, Seung Hun; Kim, Gyu-Tae; Ghibaudo, Gerard Physica E: Low-Dimensional Systems and Nanostructures, Vol.40 No.6, pp.2147-2149	DOI
2009-08	Comparative Study of the Low-Frequency-Noise Behaviors in a-IGZO Thin-Film Transistors With Al2O3 and Al2O3/SiNx Gate Dielectrics Cho, In-Tak; Cheong, Woo-Seok; Hwang, Chi-Sun; Lee, Jeong-Min; Kwon, Hyuck-In; Lee, Jong-Ho IEEE Electron Device Letters, vol. 30, no. 8, pp. 828~830	DOI