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Showing results 1 to 2 of 2

Issue DateTitle / Author(s) / CitationFileAltmetrics
2007DOI
2009

Lee, Seulki; Yoo, Jerald; Kim, Hyejung; Yoo, Hoi-Jun

2009 SYMPOSIUM ON VLSI CIRCUITS, DIGEST OF TECHNICAL PAPERS, pp.42-43

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