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A study on the diffusion barrier property of titanium nitride (TiN) thin film for Cu metallization : Cu 배선공정을 위한 TiN 박막의 확산 방지막 특성에 관한 연구

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Authors

김수현

Advisor
김기범
Issue Date
1999
Publisher
서울대학교 대학원
Description
Thesis (master`s)--서울대학교 대학원 :금속공학과,1999.
Language
English
URI
http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000072890

https://hdl.handle.net/10371/30672
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